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Crystal Identification in Dual-Layer-Offset DOI-PET Detectors Using Stratified Peak Tracking Based on SVD and Mean-Shift Algorithm

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收录情况: ◇ SCIE ◇ CPCI(ISTP) ◇ EI

单位: [1]Univ Sci & Technol Beijing, Sch Automat & Elect Engn, Beijing, Peoples R China [2]China Japan Friendship Hosp, Dept Radiat Oncol, Beijing 100029, Peoples R China [3]Tsinghua Univ, Key Lab Particle & Radiat Imaging, Minist Educ, Beijing 100084, Peoples R China [4]Tsinghua Univ, Dept Engn Phys, Beijing 100084, Peoples R China
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关键词: Crystal position map DOI-PET detector mean-shift peak tracking singular value decomposition (SVD)

摘要:
An Anger-logic based pixelated PET detector block requires a crystal position map (CPM) to assign the position of each detected event to a most probable crystal index. Accurate assignments are crucial to PET imaging performance. In this paper, we present a novel automatic approach to generate the CPMs for dual-layer offset (DLO) PET detectors using a stratified peak tracking method. In which, the top and bottom layers are distinguished by their intensity difference and the peaks of the top and bottom layers are tracked based on a singular value decomposition (SVD) and mean-shift algorithm in succession. The CPM is created by classifying each pixel to its nearest peak and assigning the pixel with the crystal index of that peak. A Matlab-based graphical user interface program was developed including the automatic algorithm and a manual interaction procedure. The algorithm was tested for three DLO PET detector blocks. Results show that the proposed method exhibits good performance as well as robustness for all the three blocks. Compared to the existing methods, our approach can directly distinguish the layer and crystal indices using the information of intensity and offset grid pattern.

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出版当年[2015]版:
大类 | 3 区 工程技术
小类 | 2 区 核科学技术 4 区 工程:电子与电气
最新[2025]版:
大类 | 2 区 工程技术
小类 | 1 区 核科学技术 3 区 工程:电子与电气
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出版当年[2014]版:
Q1 NUCLEAR SCIENCE & TECHNOLOGY Q2 ENGINEERING, ELECTRICAL & ELECTRONIC
最新[2023]版:
Q1 NUCLEAR SCIENCE & TECHNOLOGY Q3 ENGINEERING, ELECTRICAL & ELECTRONIC

影响因子: 最新[2023版] 最新五年平均[2021-2025] 出版当年[2014版] 出版当年五年平均[2010-2014] 出版前一年[2013版] 出版后一年[2015版]

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第一作者单位: [1]Univ Sci & Technol Beijing, Sch Automat & Elect Engn, Beijing, Peoples R China
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